Industry News, Trends and Technology, and Standards Updates

The old adage “You get what you pay for” doesn’t fully apply to equipment automation interfaces… more accurately, you get what you require, and then what you pay for!

This is especially true when considering the range of capability that may be provided with an equipment supplier’s implementation of the EDA (Equipment Data Acquisition, also known as Interface A) standards. Not only is it possible to be fully compliant with the standard while delivering an equipment metadata model that contains very little useful information, the standards themselves are also silent on the topics of Performance and Data Quality.  So you must take extra care to state these requirements and expectations in your purchase specifications if you expect the resulting interface to support the demands of your factory’s data analysis and control applications. Moreover, to the extent these requirements can be tested, you should describe the test methods and tools that you will use in the acceptance process to minimize the chance of ugly surprises when the equipment is delivered.

We have covered the importance of and process for creating robust purchase specifications in a previous posting. This post will focus specifically on aspects of Performance and Data Quality within that context.

Scope of Performance and Data Quality Requirements

From a scope standpoint, Performance and Data Quality requirements are found in a number of sections in an automation specification. The list below is just a starting point suitable for any advanced wafer fab – your needs may extend and exceed these significantly.

Here are some sample requirements that pertain to the computing platform for the EDA interface software:

• The interface computer should have the capability of a 4-core Intel i5 or i7 or better, with processing speed of 2+ GHz, 8 GB of RAM, and 500 GB of persistent storage with at least 50% available at all times.
• The equipment must monitor key performance parameters of the EDA computing platform such as CPU utilization (%), memory utilization (GB, %), disk utilization (GB, %) and access rate, etc. using system utilities such as Perfmon (for Windows systems) and store this history either in a log file or in some part of the equipment metadata model.
• The network interface card must support 1 GB per second (or faster) communications.

In the area of equipment model content, the following requirements are directly related to interface performance and data quality:

• The equipment should make the EDA computing platform performance parameters available as parameters of an E120 logical element that represents the EDA interface software itself.
• The supplier must provide a written description of the update rates, recommended sampling intervals, normal operating ranges and behaviors, and high/low/rate-of-change limits for all key process parameters. These will be used to design data quality filters in the data path between the equipment and the consuming applications/users.
• Equipment parameters provided through the EDA interface must exhibit a number of data quality characteristics, including, but not limited to: an internal sampling/update rate sufficient to represent the underlying signal accurately; timing of trace reports that is consistent with the sampling interval within +/- 1.0%; values in adjacent trace reports must contain then-current values at the specified sampling interval; and rejection of obvious outliers.

Advanced users of the EDA standards are now raising their expectations for the equipment to provide self-monitoring and diagnosis capability in the form of built-in data collection plans (DCPs), as expressed in some of the following requirements:

• The supplier must provide built-in DCPs to support common equipment performance monitoring, diagnostic, and maintenance processes that are well known to the supplier. Documentation for these DCPs must define their purpose, activation conditions, interface bandwidth consumed, and the types of analysis the collected data enables.
• The supplier must describe the operating conditions that can lead to a PerformanceWarning situation for the EDA interface.
• The supplier must describe the algorithms used to deactivate DCPs under PerformanceWarning conditions. These might include LIFO (i.e., the last DCP activated is the first to be deactivated), decreasing order of bandwidth consumed or “size” (in terms of total # of parameters and # of trace/event requests), etc.

Because of the power and complexity of the DCP structure defined in the EDA standards, it is not sufficient to specify the raw communications performance requirement as a small number of isolated criteria, such as total bandwidth (in parameters per second) or minimum sampling interval. Rather, since the EDA interface must support a variety of data collection client demands for a wide range of production equipment, these requirements should be expressed as combinations of sampling interval, # parameters per DCP, # of simultaneously active DCPs, group size, buffering interval, response time for ad hoc “one-shot” DCPs, maximum latency of event generation after the related equipment condition occurred, consistency of timestamps in trace reports with the specified sampling interval, and perhaps others.

Moreover, some equipment types may have more stringent performance requirements than others, depending on the criticality of timely data for the consuming applications… so there may be process-specific performance requirements as well.

Measurement and Testing

Methods for measuring and testing the above requirements should also be described in the purchase specifications so the equipment suppliers can know they are being successfully addressed during the development process and can demonstrate compliance before and after shipping the equipment. Clarity at this phase saves time and expense later on.

Examples of such requirements include:

• The supplier must test the EDA interface across the full range of performance criteria specified above and provide reports documenting the results.
• An earlier requirement states that the EDA interface must be capable of reporting at least 2000 parameters at a sampling interval of 0.1 seconds (10Hz) with a group size of 1, for a total data collection capacity (bandwidth) of 20,000 parameters per second. In addition to this overall bandwidth capability, the supplier must demonstrate that this performance is possible over a range of specific data collection deployment strategies, meaning different #s and sizes of DCPs, different sampling intervals, group sizes, etc. without causing the EDA interface to reach one of its “Performance Warning” states or overstress its computing platform. To this end, all combinations of the following data collection configuration settings must be run for at least 15 seconds each; assuming the equipment has n processing modules:
  • Trace intervals (in seconds): 1, 0.5, 0.2, 0.1 (and 0.05 if possible)
  • # of parameters per DCP: 10, 50, 100, 250, 500, 1000 (and 2000 if possible)
  • # of DCPs: 1, 2, 3, … to n
  • Group size: 10, 5, 2, 1
• The test client should be run on a separate computing platform with sufficient computing power to “stay ahead” of the EDA interface computer; in other words, the EDA interface should never have to wait on the client system.
• Test reports should indicate the start and stop time of each iteration (i.e., one combination of the above settings), and verify that the timestamps of the data collection reports sent by the EDA interface are within +/- 1% of the value expected if the samples were collected exactly at the specified trace interval.

Performance parameters of the EDA interface platform should also be monitored during the tests and included in the report. These parameters should include memory usage, CPU processing load, and disk access rate (and perhaps others) for all processes that constitute the EDA interface software.

This approach is shown in tabular form for a 2-chamber tool (see below); since Group Size does not (or should not) impact the effective parameters per second rate, it is not shown in the table.

• A summary report for all performance tests that show acceptable message generation and transmission timing across the full range of data collection test criteria must be available.
• Detailed SOAP logs for specific performance tests must be available on request.

In Conclusion

We hope you now have some appreciation for the importance of solid requirements in this area, and can accurately assess how well your current purchase specifications express your actual needs. If you want to know more about a well-defined process for improving your specifications, or have any other questions regarding the status and outlook of the EDA standards, and how they can be implemented, please contact us.

Today is our next edition of the Cimetrix Book Club. Our employees are always striving to develop their skills, share information, and keep up to date with the industry. Part of this effort includes an employee book club that involves many of our team members each month. We will cover some of their favorites from time-to-time here on our blog!

Today's book is called "Microsoft Visual C# Step by Step – Eighth Edition" by John Sharp. The book review is by Richard Andrew, a Software Engineer based in Salt Lake City, UT, USA.This book was designed to be an overview of the programming language, C# and cover the breadth of most topics while delving in depth on some of the topics.  It was designed to be helpful for even the most novice developers while still being useful to advanced programmers looking to sharpen their craft.  This was perfect for our group because we had a mix of aspiring developers (or developers who hadn’t spent much time programming yet), experienced developers who were new to C#, and experienced developers just looking to get better and learn new things about the language and about best practices.

The Book was split up into four sections. The first two sections focused on general programming practices and structure that are important to any programming language but written in a way that was applicable for C#. These sections mainly focused on breadth and covering many topics. This was especially helpful for our aspiring developers and the developers who were just learning or becoming familiar with C#. For our more experienced developers, these sections were more of review or relearning what they already knew.

Section three dove deeper into more advanced programming topics and provided a good overview for some of our novice developers, but it was really geared for a more experienced developer. This section talked about generics, collections, event handling and querying expressions. Lots of new tools to add to our kits.

Section four focused primarily on building Graphical User Interfaces (GUIs) with C#, and the author specifically chose to highlight using UWP applications (Universal Windows Platform). This section on the surface seemed to be less relevant to what we were working on. But after reading and looking looking at the code behind it, it became very relatable to WPF (Windows Presentation Foundation), which is an application we use in our products. This section was also extremely helpful for anybody seeking to become Microsoft Certified. As we currently have several engineers in our group striving to become Microsoft Certified, this section was helpful preparation. 

All in all this book was excellent for our team. It gave an introduction and an overview to our novice developers while still providing a lot of education to our more experienced developers. A great thing about this book were the examples in each section that, when we really dug in, gave us rich knowledge and context to everything the author was trying to convey. You really get out what you put into the study of this book. 

SEMICON West 2019 has come and gone! The annual trade show and technical conference was held this year at Moscone Center in San Francisco and turned out to be a very busy time for the Cimetrix team. The trade show lasted three days and filled two halls, including the newly renovated South Hall. We had many meetings with current clients, met with new potential clients and even made a few new friends along the way.

This year has been an interesting one, with the semiconductor capital equipment industry seeing a downturn. In January at ISS, the consensus was the trough for semiconductor capital equipment makers would be Q2 with growth returning in Q3 and Q4. Now, the consensus is the recovery in the chip memory market and manufacturing expansion may not happen until mid-2020. However, people also say the visibility is only for the next 3-6 months, so this could change. Many of our customers are affected by this downturn – the severity varying by their customer base and territory. Customers that are focused solely on semiconductor 300mm wafer fabs with a strong exposure to memory, have been hit the hardest with declines in revenue up to 50% from 2018 levels. Customers that have more diverse product lines and sell to semiconductor back-end or electronics markets are doing much better. While this downturn is affecting our customers to varying degrees, we had many executive meetings with virtually all of them expressing continued satisfaction and appreciation regarding the high quality of our products and technical support.

We also had two speakers at the Meet-the-Experts tech stage within the Smart Manufacturing Pavilion. Brian Rubow, Director of Solutions Engineering, spoke on how to get the most out of the GEM standard, including following what the standard says and fixing implementations using sound software practices. You can view his presentation here. Alan Weber, VP of New Product Innovations also spoke on Addressing Connectivity Challenges of Disparate Data Sources in Smart Manufacturing, addressing the road to the smart, digital and connected factory. You can view his presentation here.

Cimetrix continues to strengthen our relationship with SEMI by our global leadership and participation in SEMI standards meetings as well as our sponsorship of the Smart Manufacturing Pavilion. We sponsored a kiosk in the Pavilion where we connected our new Sapience platform for Smart Manufacturing to a BTU reflow oven, which generated quite a bit of excitement.

SEMI Standards meetings continue to be a priority for Cimetrix. We are well represented at the standards meetings by chairing/co-chairing various committees and attending/participating in others. The following are some of the areas of significance.

• The DDA task force continues to develop EDA Freeze 3 standards with adoption of cutting edge gRPC technology to improve performance.
• The Fab & Equipment Computer and Device Security (CDS) Task Force received approval for two SNARFs (Standards New Activity Report Form) - "SNARF: Specification for Application Whitelisting" and "SNARF: Malware Free Equipment Integration". The SNARFs were created by the CDS task force and approved by the Information and Controls global technical committee which Brian co-chairs.
• The North American Information & Control Committee at SEMI established a new task force Advanced Backend Factory Integration (ABFI) to define and update standards to meet the needs of the semiconductor backend industry. Brian Rubow from Cimetrix, Dave Huntley from PDF Solutions are two of the task force co-leaders.

During the SEMICON West show, an article was published, written by Cimetrix VP and GM, Smart Factory Solutions Ranjan Chatterjee and Dan Gamota, VP, Manufacturing technology and Innovation for Jabil. The article called “Smart Manufacturing Roadmap: Data Flow Considerations for the Electronics Manufacturing Industry” can be found here. This article identifies technology gaps and needs, and offers recommendations to guide the electronics manufacturing industry in realizing the benefits of smart manufacturing and is sponsored by iNEMI. Mr. Chatterjee and Mr. Gamota are co-chairs of the new smart manufacturing chapter of iNEMI.

The Cimetrix team was excited to once again be an exhibitor and sponsor of the SEMICON West show. This is always a great show and we were very pleased to attend once again. We are already looking forward to SEMICON West 2020!

To view the presentations from SEMICON West, and many more, click on the button below.

In this our first standard overview, we look at GEM. At its history, its application and its suitability for use in the smart factories of today and the future.

Overview

The GEM standard defines a software interface that runs on manufacturing equipment. Factories use the GEM interface to remotely monitor and control equipment. The GEM interface serves as a broker between the factory host software (host) and the manufacturing equipment’s software. Because the GEM standard is an open standard, anyone can develop GEM capable host or equipment software.

The GEM standard is published and maintained by the international standards organization SEMI based in Milpitas, CA, USA. SEMI uses the standard designation “E30” to identify the GEM standard with the publication month and year appended as four numbers to designate a specific version. For example, E30-0418 identifies the version of the GEM standard published in April of 2018.

The GEM/SECS-II standards are protocol independent. Today, there are two protocols defined by SEMI: SECS-I (E4) for serial communication and HSMS (E37) for network communication. SECS stands for ‘SEMI Equipment Communications Standard’ and HSMS stands for ‘High-Speed SECS Message Services’.

Not surprisingly, most systems today are using the HSMS. HSMS does not specify the Physical Layer. Any physical layer supported by TCP/IP can be used, but typically everyone uses an Ethernet network interface controller (NIC) with an RJ45 port. When using the SECS-I standard, the messages size is limited to 7,995,148 bytes (about 8MB).

The GEM standard is built on top of SEMI standard SECS-II (E5). The SECS-II standard defines a generic message layer to transmit any data structure and defines a set of standard messages each with a specific ID, purpose and format.

History and Adoption

GEM was developed by the semiconductor industry to allow fabricators to connect and manage multiple machines in billion dollar facilities all around the world.

GEM is the adopted technology by factories worldwide because it is mature and supports all the features required now and expected in the future. GEM allows the same technology and software to be used to integrate multiple equipment and process types, independent of supplier.

The GEM standard is used in numerous manufacturing industries across the world, including semiconductor front end, semiconductor back end, photovoltaic, electronics assembly, surface mount technology (SMT), high brightness LED, flat panel display (FPD), printed circuit board (PCB) and small parts assembly. The adaptability of the GEM standard allows it to be applied to just about any manufacturing industry.

All semiconductor manufacturing companies including Intel, IBM, TSMC, UMC, Samsung, Global Foundries, Qualcomm, Micron, etc., currently use the GEM standard on all manufacturing equipment and have for many years. This includes 300mm, 200mm and 150mm wafer production.

GEM was successful enough early on that SEMI developed and currently uses several additional factory automation standards based on GEM technology. These additional standards are referred to as the GEM 300 standards, named because of their widespread adoption by the factories dedicated to the manufacturing of 300mm wafers.

In 2008, the photovoltaic (solar cell) industry officially adopted GEM with SEMI standard PV2 (Guide for PV Equipment Communication Interfaces) which directly references and requires an implementation of the GEM standard. In 2013, high-brightness LED industry created a similar SEMI standard HB4 (Specification of Communication Interfaces for High Brightness LED Manufacturing Equipment). Recently, the printed circuit board association has followed in the same path with ballot 6263 (Specification for Printed Circuit Board Equipment Communication Interfaces). All three standards similarly define implementations of the SEMI standard that increase GEM’s plug-and-play and mandate only a subset of GEM functionality to facilitate GEM development on both the equipment and host-side.

Several additional SEMI standards have been created over the years to enhance GEM implementations and are applicable to any industry and equipment. E116, Specification for Equipment Performance Tracking, defines a method to measure equipment utilization as well as the major components within the equipment. E157, Specification for Module Process Tracking, allows an equipment to report the progress of recipe steps while processing. E172, Specification for SECS Equipment Data Dictionary, defines an XML schema for documenting the features implementing a GEM interface. E173, Specification for XML SECS-II Message Notation, defines an XML schema for logging and documenting messages.

Flexibility and Scalability

GEM requirements are divided into two groups; Fundamental Requirements and Additional Capabilities. Any equipment that implements GEM is expected to support all the Fundamental Requirements. Additional Capabilities are optional and therefore are only implemented when applicable. This makes the GEM standard inherently flexible so that both a simple device and a complex equipment can implement GEM.

GEM easily and inherently scales to the complexity of any system. A simple device need only implement the minimum functionality to serve its purpose. Whereas complex equipment can implement a fully featured GEM interface to allow the factory to fully monitor and control its complex functionality. GEM also allows multiple host applications to connect to an equipment.

The requirements in that the GEM standard only apply to the equipment and not the host. This means that equipment behavior is predictable, but the host can be creative and selective choosing to use whichever features from the equipment’s GEM interface to attain it goals.

Our Seven Point Checklist

Remember our simple seven-point checklist for connectivity from our original article:

• Event Notification – real-time notification of activity & events
• Alarm Notification – real-time notification of alarms & faults
• Data Variable Collection – real-time data, parameters, variables & settings
• Recipe Management – process program download, upload, change
• Remote Control – start, stop, cycle stop, custom commands
• Adjust Settings – change equipment settings & parameters
• Operator Interface – send & receive messages to/from operator

Put simply GEM succeeds in each of these areas and you can find more detail by downloading our white paper or watching the videos on our website.

Conclusion

If you’re looking for a tried and tested standard that can be applied to any smart manufacturing ecosystem, no matter how large, it’s hard to beat GEM. The semiconductor industry is one of the most demanding and expensive industries in the world and they have done the work for everyone else at great cost and over many years. Industries like PCB fabrication are adopting this standard rather than developing their own for good reason, they need something that can be applied quickly, reliably, economically and at scale.

Forgive the pun but, we believe GEM is the gold standard for standards. We’ve been working with it successfully for decades in the semiconductors industry and more recently in PCB and SMT facilities. In some cases, we have deployed GEM at the request of OEM customers to drive greater control and traceability in their supply chain.

This blog was first posted on EMSNow.com.

SEMICON West is almost here and we’re excited to once again be participating this year as both an exhibitor and as a sponsor of the Smart Manufacturing Pavilion! Visit us any time at our booth 1644 in the South Hall, at our kiosk (#1364) in the Smart Manufacturing Pavilion, or at the Meet the Experts Theater which will feature Cimetrix speakers on Tuesday and Wednesday.

SEMICON West will once again be held in the Moscone Center in San Francisco, CA, USA from July 9-11. The theme this year is “Insight, Innovations & Intelligence: Our industry – and the world – is moving beyond smart.” We couldn’t be more excited about the momentum of the semiconductor industry. As Industry 4.0 and the demand for Smart Manufacturing solutions have become more prevalent, we’ve seen our market expand beyond the equipment manufacturers to encompass all phases of the electronics manufacturing process and corresponding elements of the supply chain. To achieve a smart, connected factory, you must first have equipment that can communicate effectively, which is where Cimetrix has always excelled. Our well-known and award-winning products enable every semiconductor manufacturer in the world to connect their equipment to the factory information and control systems. SEMICON West has always been an important event for meeting with current clients, making new contacts, collaborating in the SEMI Standards community, and developing relationships with thought leaders across the manufacturing spectrum.

The rapid and continuous growth of manufacturing data is now driving demand for new analysis technologies that can further leverage its value. The Smart Manufacturing Pavilion is a great place to see some of the breakthroughs that are creating smarter processes and spurring innovation across the industry.  The pavilion once again includes a Meet the Experts Theater, and Cimetrix has two opportunities to address the audience. Brian Rubow, Director of Solutions Engineering, will speak on “Getting the Most from the GEM Standard” on Tuesday July 9 from 1:30 – 2:00 pm. Alan Weber, VP of New Product Innovation, will talk about “Addressing the Connectivity Challenges of Disparate Data Sources in Smart Manufacturing” on Wednesday July 10 from 3-3:30 pm.  

The Smart Manufacturing Pavilion and its Meet the Experts Theater are in the South Hall and we hope to see you there! Or, as always, you can visit our booth 1644 any time during the show.

Cimetrix attended the recent JISSO PROTEC exhibition (June 5-7, 2019) at the Tokyo Big Sight International Exhibition Center to see the latest developments in SMT (Surface Mount Technology) manufacturing… and witnessed a truly compelling demonstration of the new SEMI Flow Manufacturing communications standards in action.

The new suite of standards is named SMT-ELS (Surface Mount Technology-Equipment Link Standards), and includes SEMI A1/1.1 as a lower-level messaging standard with SEMI A2 SMASH (Surface Mount Assembler Smart Hookup) defining the content of the messages required to configure an SMT manufacturing line and automate the material and information transfer among all equipment in that line. This is depicted in the figure below.

The demonstration itself included placement equipment from 4 large equipment suppliers—Fuji, JUKI, Panasonic, and Yamaha—as well as load/unload stations and a bar code reader at the beginning of the line (see picture below). Each of these companies had implemented the “horizontal” (machine-to-machine) communications according to the SMT-ELS standards. The demonstration consisted of an operator scanning one of the stack of input boards with the barcode reader, placing it on the loader conveyor, and then watching as each piece of equipment automatically adjusted its internal conveyor to accept the board, run through its part placement recipe, and pass the board to the next equipment in the line, finally arriving at the unload station conveyor after a minute or so.

The Cimetrix Resource Center is a great tool for anyone who wants to learn more about industry standards including Equipment Connectivity and Control, data gathering, GEM (SECS/GEM), EDA/Interface A, and more. These standards are among the key enabling technologies for the Smart Manufacturing and Industry 4.0 global initiatives that are having a major impact on many industries. Manufacturers and their equipment suppliers must be able to connect equipment and other data sources, gather and analyze data in real time, and optimize production through a wide variety of applications. The free eBooks listed below provide in-depth coverage of the some of these concepts.  They have been written by technical experts who have participated in and led the standards development processes for more than two decades.

• Features and Benefits of GEM
• Implementing Equipment Control Applications using CCF
• EDA Applications and Benefits for Smart Manufacturing
• Models in Smart Manufacturing

Be sure to stop by our Resource Center any time or download the white papers directly from the links in this posting.

Today we are introducing the Cimetrix Book Club on our blog. Our employees are always striving to develop their skills, share information, and keep up to date with the industry. Part of this effort includes an employee book club that involves many of our team members each month. We will cover some of their favorites from time-to-time here on our blog!

Today's book is called "Agile Testing: A Practical Guide for Testers and Agile Teams" by Lisa Crispin and Janet Gregory, two of the industry’s most experienced agile testing practitioners and consultants. The book review is by Morgan Kap, a QE Engineer based in Salt Lake City, UT, USA.This book on agile testing is a great high-level explanation of how testing fits into an agile development team. The focus of this book is on how to successfully transition a team to an agile methodology, or to create a new QE/testing team in an agile methodology. While our team was already practicing agile before we read the book, it had quite a bit of valuable knowledge that led our team to make changes in how we tackle daily testing tasks.

One of the main changes we made immediately was to slightly restructure our team, and we have become a more effective team as a result. This book on Agile Testing is full of real-world stories of testing success and failures. These stories show the importance of techniques and tools, outlined for easy understanding in the book, for developing an efficient and complete testing process.

Some of the major focus points include being test driven during development and the many benefits this can create for all types of projects. Another focus details the many ways a software product should be tested; from security to usability. There is even a chapter focusing on how an office’s culture can have an impact on testing. This topic led to our team to try a few new things to make our culture more fun and interesting. This now includes having rubber ducks on every desk - that's a long-story, but we love it.

Overall, "Agile Testing: A Practical Guide for Testers and Agile Teams" by Lisa Crispin and Janet Gregory, is a great starting point for those quality engineering teams that searching for ideas and way to improve and understand many of the important aspects of testing software. 

Cimetrix just finished exhibiting at SEMICON Southeast Asia for the first time. And a grand entrance it was. Located in Kuala Lumpur, Malaysia, this is one of the regional SEMICON shows put on by SEMI, a global industry association serving the manufacturing supply chain for the electronics industry. Southeast Asia is a hotbed for semiconductor backend and PCBA (SMT) industries. With our new employee Raymund Yeoh located in Penang, Malaysia; combined with our distribution partner Electrotek based out of Singapore, Cimetrix now has a strong presence to support Industry 4.0 adoption in Southeast Asia. 

By working closely with SEMI, Cimetrix had a new booth in the SEMI Smart Manufacturing Pavilion and an impressive demonstration in the SEMI Smart Manufacturing Journey.

Our new booth emphasized (1) our global reach as the world’s largest supplier of equipment connectivity and control software, (2) our new Sapience^TM factory side platform which has beta installations at select major EMS and electronics manufacturing sites, and (3) our new EquipmentTest^TM connectivity tester designed to make equipment connectivity easier than ever before.

Our booth was extremely busy the whole time with demonstrations of Sapience and EquipmentTest. We gave out vouchers for free copies of EquipmentTest to booth visitors which generated excitement and will increase learning for GEM connectivity in Southeast Asia. It was interesting to see the number of factory engineers and managers who visited us seeking help with getting their equipment connected for traceability and OEE (Overall Equipment Effectiveness). And we had the answers. Right next door to our booth was the SEMI Smart Manufacturing Journey which had guided tours demonstrating the use of Industry 4.0 throughout the electronics manufacturing supply chain. Our job was to demonstrate data collection using standards from live equipment in real time displaying OEE charts and data for each tour to witness. Setting this up can take months in a factory. Our Smart Factory Business Team is out to turn this problem upside down. They connected to all 4 live equipment in one day and were ready to go at the start of the show. And we are ready to do that in factories too. 

Here is Mike and Jesse giving a demonstration to a tour group. The equipment is located right behind the crowd for all to see; with Sapience displaying data and the crowd taking pictures. SEMI did a great job organizing this. We had top government officials, factories, equipment manufacturers, electronics distributors and universities come through the tours. We also exceeded expectations by adding artificial intelligence to the demonstration. Amazon Alexa was integrated into Sapience which allowed us to ask Alexa which factory was most productive last week. Alexa and Sapience analyzed the data and gave the answer to the tour crowd.

We have many new opportunities to follow up; and we will be working with SEMI on how to help companies in Southeast Asia learn and adopt Industry 4.0.

Following the show, our team spread out to visit the rapidly growing Cimetrix customer base in Penang, Korea, India and China with support from our local teams. See you next year in SEMICON Southeast Asia!

 

A few years ago, I went through the process of building a new house. It was exciting to work with the architect to design the house and imagine what the finished product was going to be like. The architect created a 40-page set of drawings detailing all the components that would go into the house, like the electrical, plumbing and flooring. I thought everything was covered. I was a little surprised when things didn’t go exactly as detailed in the drawings. There were exceptions! However, having the detailed drawings made it easier to identify where things went wrong and helped clarify what needed to be done to correct the problems.

Communication standards like GEM are like a set of architectural drawings for how to connect equipment to factory control systems. They define what needs to be communicated, how the communication needs to take place and provide a great roadmap for getting there. But like building a new house, there are usually a few surprises along the way. A standard, consistent way of testing the interface that can be used by both the factory and equipment manufacturer, greatly reduces the unknown and simplifies the process.

The new Cimetrix EquipmentTest™ product is the fastest way to achieve GEM Compliance for factory acceptance testing of new equipment. Whether you are an equipment manufacturer or factory, making sure the equipment interface is GEM compliant is critical. Having an easy-to-use testing solution to determine if the equipment is GEM compliant is critical.

There are two versions of EquipmentTest depending on your needs. The EqupmentTest Basic version is ideal for both Smart factories and equipment manufacturers to quickly and easily test the basic capabilities of an equipment’s GEM interface. EquipmentTest Basic includes a simple testing scenario, called a plugin, to evaluate the equipment’s ability to connect to a GEM host and communicate events, data and alarms. This version also includes the ability to send/receive individual messages to/from the equipment for discovery or diagnostic purposes. With the messaging functionality, you can also create macros to send and receive groups of messages.

For more complex testing, there is the EquipmentTest Pro version. In addition to all the features of the EquipmentTest Basic version, EquipmentTest Pro includes a full, rigorous GEM compliance testing plug-in and an operational GEM compliance testing plugin. The Pro version includes development tools to allow you to create your own custom tests/plug-ins using .NET languages. The GEM compliance plugin generates a GEM compliance statement that shows the areas and level of compliance to the GEM standards. There are also other tools only available in the EquipmentTest Pro version that allow you easily test and interact with the GEM functionality on the equipment.

As with all our products, Cimetrix supports the industry connectivity standards so you never have to wonder if your equipment is keeping up with the rest of the industry.

You can purchase either version of EquipmentTest directly from our website and download the software immediately. You will need to provide a valid Mac ID and email address for licensing purposes. You will receive your license agreement no more than 48 hours after purchase. Be sure to learn more and get your EquipmentTest download today!